for those who still doubt ...
gosh ... I thought we were through with this ...
again, I apologize for not making myself more clear ...
moving forward ... I still say that my original “all go off at the same time” test is perfectly valid to prove the concept - but for simplicity’s sake, let’s nail this thing down with an apples-to-apples experiment ... I just used some of my student wiring lab equipment and hooked up EIGHT Normally Closed pushbuttons in series with each other ... I used these in a common holding circuit to “seal in” a real world contactor ... here’s the schematic ...
I had a MicroLogix1000 handy with TEN inputs ... I connected input 9 to monitor the AC Line ... I connected inputs 8 through 1 to monitor the “stop buttons” ... I connected the last input (0) to monitor the contactor’s auxiliary contacts ...
and here’s a couple of snapshots of the setup ...
when I energized the contactor, ALL of the Micro’s inputs lit up ...
and here’s the quick “down and dirty” program which I used to record the status of ALL of the input bits as soon as ANY bit went OFF ... (note: if anyone has another program they’d like to try, just post it) ...
with everything ready to roll, I pushed “stop button C” and naturally the contactor dropped out ... I recorded the data ... I reset the contactor ... I reset the trap bit ...
I pushed “stop button C” and the contactor dropped out ... I recorded the data ... I reset the contactor ... I reset the trap bit ...
I pushed “stop button C” and the contactor dropped out ... I recorded the data ... I reset the contactor ... I reset the trap bit ...
I did this same test ONE HUNDRED times in a row ... here’s the data that was recorded ...
now even though I pushed the SAME button (C) EVERY SINGLE time, the data that was recorded was NOT always the same ...
I’ve highlighted the actual bit (6) that caused EACH and EVERY drop out condition ... a “good” test would have given a decimal value of 896 ... and most of the time (81%), that’s what was recorded ... BUT ... (and here’s my point) the data was NOT ALWAYS correct ... specifically, 19% of the time a RANDOM bit pattern resulted ...
for a specific example, take a look at the data in test #44 ... that one is especially troublesome ... if we had never covered the issues that I’ve brought up in this thread, what conclusion would most reasonable technicians come up with while considering the data from that particular test? ... I submit that the most logical conclusion would be that the contactor’s auxiliary contacts are causing the contactor to drop out ... but that perfectly logical conclusion is WRONG - because the ONLY button that I ever used to drop out the circuit was button C ...
now an electrically knowledgeable technician might look at all of this ERRONEOUS test data and say: “Wait a minute. If a midstream bit goes OFF, then why don’t all of the bits downstream of that bit go OFF also?” ... bingo! - that’s a very good question ... now how are we going to explain the various “random bit patterns” in those erroneous tests? ... I submit that you can NOT adequately explain those data readings WITHOUT understanding the concepts that I keep harping on ...
regardless of how you choose to slice it, my point has been made ... again ...
personally, I think that I said it best back in post #36 ...
in a nutshell: PLCs are fast - but they are NOT instantaneous ... and (KEY POINT) some of their inputs may react quicker than others ... many (most?) people don't know that ...
in the spirit of the forum, I’m just trying to make more people aware of a POTENTIAL issue that many (most?) technicians never even consider ... anyone who doesn’t believe what I’m saying, is perfectly welcome to set up the test and run the experiments for themselves ... I assure you that I am NOT making this up ...
my question is this: how on earth would you program the PLC to interpret this RANDOM data and come up with an accurate assessment of which was the “first out” bit? ... (and before anyone suggests incorporating a “filter” or “settling” or “debounce” arrangement, please consider how that might adversely affect the ability to spot a defective contact which is only very briefly and intermittently open) ...
now as for the “ready made” Tattle Tale that Geniusintraining kindly showed us in post #44 ... I really do NOT know how that’s going to work ... maybe it will work PERFECTLY ... I really hope that it does ... but as GIT said:
I am going to meet with Ron in the near future so I may have to lend it to him for some bench testing
good to hear that you’re finally coming down this way, Mark ... by all means bring that thing along with you and we’ll test it out while you’re here ... I’ll post the results on the forum as soon as the test is done ... personally I wouldn’t bet more than pocket change on the outcome one way or the other ... but on the PLC Tattle Tale being discussed in this thread - well, that’s a different situation ... I still maintain that a “First Out” tester based on a PLC is not going to be 100% reliable ... it might work well enough to be useful - but if more than one input can electrically change state simultaneously, then personally I wouldn’t bet the rent on its accuracy ...